Author Details
Волковский, Ю. А.
| Issue | Section | Title | File |
| Vol 68, No 2 (2023) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | COMPARATIVE X-RAY DIFFRACTOMETRY OF THE DEFECT STRUCTURE OF ZnO EPITAXIAL FILMS DEPOSITED BY MAGNETRON SPUTTERING ON C-PLANE Al2O3 SUBSTRATES IN INHOMOGENEOUS ELECTRIC FIELD | |
| Vol 68, No 1 (2023) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens | |
| Vol 68, No 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | DEVELOPMENT OF X-RAY METHODS FOR STUDYING PROTEIN PLANAR SYSTEMS ON A LIQUID SURFACE USING SYNCHROTRON RADIATION | |
| Vol 69, No 6 (2024) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | Experimental Study of the Method of X-ray Phase-Contrast Microscopy Using a Nanofocusing Lens at KISI-Kurchatov synchrotron source |