Informaçao sobre o Autor
Тихонов, М. И.
| Edição | Seção | Título | Arquivo |
| Volume 69, Nº 2 (2024) | PHYSICAL PROCESSES IN ELECTRONIC DEVICES | Application of tracing tools for analysis of microcontroller failures arising under the 14 MeV neutrons exposure |
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Palavras-chave
M-sequences
band gap
chaotic oscillations
composite materials
coupled oscillators
digital electronics
dispersion characteristics
electron population oscillations in a semiconductor
exact solutions
heterostructure
high-order fractional transfer functions
magnetocaloric effect
measurement error
nonlinear oscillations
nuclear magnetic resonance
photonic crystal
reflection coefficient
spin waves
stimulated picosecond emission
surface acoustic waves
synthesis
Edição corrente
Volume 70, Nº 6 (2025)
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Usuário
Assinatura
Entrar no sistema para verificar sua assinatura
Palavras-chave
M-sequences
band gap
chaotic oscillations
composite materials
coupled oscillators
digital electronics
dispersion characteristics
electron population oscillations in a semiconductor
exact solutions
heterostructure
high-order fractional transfer functions
magnetocaloric effect
measurement error
nonlinear oscillations
nuclear magnetic resonance
photonic crystal
reflection coefficient
spin waves
stimulated picosecond emission
surface acoustic waves
synthesis
Edição corrente
Volume 70, Nº 6 (2025)
Informações