Russian Microelectronics
ISSN 0544-1269 (Print)
ISSN 3034-5480 (Online)
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Keywords
Förster effect
bipolar transistor
diagnostics
etching
gas temperature
ionization
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
powerful LDMOS
quantum dot
reduced electric field strength
resistive switching
silicon
silicon-on-insulator technology
specific power
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Author Details
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Lopatin, A. Ya.
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Vol 52, No 5 (2023)
ЛИТОГРАФИЯ
Protective Freely Hanging Films for Projection Lithography Installations in the Extreme UV Range
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