English
Русский
Eco-vector
Poverhnostʹ. Rentgenovskie, sinhrotronnye i nejtronnye issledovaniâ
ISSN 1028-0960 (Print)
Menu     Archives
  • Home
  • About the Journal
    • Editorial Team
    • Editorial Policies
    • Author Guidelines
    • About the Journal
  • Issues
    • Search
    • Current
    • Retracted articles
    • Archives
  • Contact
  • Subscriptions
  • All Journals
Pay with
User
Forgot password? Register
Notifications
  • View
  • Subscribe
Search
Browse
  • By Issue
  • By Author
  • By Title
  • By Sections
  • Other Journals
  • Categories
Subscription Login to verify subscription
Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Current Issue

No 3 (2025)

Information
  • For Readers
  • For Authors
  • For Librarians
×
Pay with
User
Forgot password? Register
Notifications
  • View
  • Subscribe
Search
Browse
  • By Issue
  • By Author
  • By Title
  • By Sections
  • Other Journals
  • Categories
Subscription Login to verify subscription
Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Current Issue

No 3 (2025)

Information
  • For Readers
  • For Authors
  • For Librarians
Home > Search > Author Details

Author Details

Корнев, С. А.

Issue Section Title File
No 3 (2025) Articles Change in the charge state of MOS structures under radiation and high-field injection at constant voltage
 

 

Developed by ECO-VECTOR

 

Powered by EVESYST

TOP