Author Details
Shevyrtalov, S. А.
| Issue | Section | Title | File |
| No 12 (2024) | Articles | High-resolution x-ray micro-optics: technologies and materials |
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
density functional theory
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
scanning probe microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Current Issue
No 3 (2025)
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User
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
density functional theory
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
scanning probe microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Current Issue
No 3 (2025)
Information