Study of SiO2 films implanted with 64Zn+ ions and oxidized at elevated temperatures
- Авторлар: Privezentsev V.V.1, Sergeev A.P.1, Firsov A.A.1, Kulikauskas V.S.2, Zatekin V.V.2, Kirilenko E.P.3, Goryachev A.V.3, Kovalskiy V.A.4
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Мекемелер:
- FSC “Scientific Research Institute for System Analysis RAS”
- Lomonosov Moscow State University
- Institute of Nanotechnology Microelectronics RAS
- Institute of Microelectronics Technology RAS
- Шығарылым: № 4 (2024)
- Беттер: 62-67
- Бөлім: Articles
- URL: https://gynecology.orscience.ru/1028-0960/article/view/664658
- DOI: https://doi.org/10.31857/S1028096024040082
- EDN: https://elibrary.ru/GIWFUR
- ID: 664658
Дәйексөз келтіру
Аннотация
The results of studying SiO2 films implanted with 64Zn ions with a dose of 5 × 1016 cm–2 at energies of 20 and 120 keV and isochronously oxidized for 1 h at temperatures from 400 to 800°C with a step of 100°C are presented. The profiles of Zn and its oxide were studied using Rutherford backscattering and time-of-flight secondary ion mass spectrometry. The chemical state of zinc and the phase composition of the film were determined by Auger electron spectroscopy and Raman scattering. It was found that after implantation, the zinc distribution had two maxima at depths of 20 and 85 nm, and after annealing at 700°C there was a broadened maximum at a depth of 45 nm. After implantation, a mixture of Zn and ZnO phases was formed in the sample. After annealing at 700°C, only the ZnO phase was formed in the sample, the distribution profile of which had a broadened peak at 45 nm.
Толық мәтін

Авторлар туралы
V. Privezentsev
FSC “Scientific Research Institute for System Analysis RAS”
Хат алмасуға жауапты Автор.
Email: v.privezentsev@mail.ru
Ресей, 117218, Moscow
A. Sergeev
FSC “Scientific Research Institute for System Analysis RAS”
Email: v.privezentsev@mail.ru
Ресей, 117218, Moscow
A. Firsov
FSC “Scientific Research Institute for System Analysis RAS”
Email: v.privezentsev@mail.ru
Ресей, 117218, Moscow
V. Kulikauskas
Lomonosov Moscow State University
Email: v.privezentsev@mail.ru
Skobeltsyn Institute of Nuclear Physics
Ресей, 119991, MoscowV. Zatekin
Lomonosov Moscow State University
Email: v.privezentsev@mail.ru
Skobeltsyn Institute of Nuclear Physics
Ресей, 119991, MoscowE. Kirilenko
Institute of Nanotechnology Microelectronics RAS
Email: v.privezentsev@mail.ru
Ресей, 119991, Moscow
A. Goryachev
Institute of Nanotechnology Microelectronics RAS
Email: v.privezentsev@mail.ru
Ресей, 119991, Moscow
V. Kovalskiy
Institute of Microelectronics Technology RAS
Email: v.privezentsev@mail.ru
Ресей, 142432, Chernogolovka
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